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MODULE 1 — Process Control Foundations (SMT Focused)

1.1 Why Screen Printing Needs SPC & DOE

  • Screen printing as the primary SMT yield driver
  • Relationship between paste volume variation and defects
  • Why inspection ≠ control

1.2 Key Screen Printing CTQs

  • Solder paste volume
  • Paste height & area
  • Transfer efficiency
  • Print definition

1.3 Data Sources

  • SPI measurement data
  • Pad-level vs component-level data
  • Sampling strategy

MODULE 2 — SPC for Solder Paste Deposition

2.1 SPC Concepts (Practical)

  • Common vs special cause variation
  • Control limits vs specification limits
  • Subgrouping for SMT data

2.2 Control Charts for Screen Printing

  • X-bar & R charts (paste volume)
  • I-MR charts (low volume / NPI)
  • Attribute charts (print defects)

2.3 Using SPI Data in SPC

  • Volume vs height vs area
  • Chart interpretation
  • Reaction plans for out-of-control conditions

MODULE 3 — Process Capability (Cp / Cpk) Using SPI Data

3.1 Understanding Cp & Cpk

  • Cp vs Cpk in manufacturing terms
  • Why Cpk matters more than yield

3.2 Cpk Analysis for Paste Volume

  • Defining volume specifications
  • Calculating Cpk from SPI data
  • Interpreting low Cpk causes

3.3 Using Cpk to Drive Action

  • Printer setup adjustments
  • Stencil design changes
  • Paste or coating decisions

MODULE 4 — DOE for Screen Printing Optimization

4.1 Why DOE (Not Trial-and-Error)

  • Confounding effects
  • Interaction between print parameters

4.2 Screen Printing DOE Factors

  • Squeegee speed
  • Squeegee pressure
  • Separation (release) speed
  • Stencil thickness / coating
  • Solder paste type

4.3 DOE Responses

  • Paste volume
  • Volume variation (σ)
  • Transfer efficiency
  • Cpk improvement

MODULE 5 — DOE Execution, Analysis & Control Integration

5.1 Running a Practical DOE

  • Screening vs factorial DOE
  • Data collection via SPI
  • Randomization & replication

5.2 DOE Analysis

  • Main effects plots
  • Interaction plots
  • Identifying significant factors

5.3 Locking in Gains with SPC

  • Optimized process window
  • Updating control limits
  • Sustaining Cpk improvement over time

Outcome of the Course

After this training, engineers can:

  • Monitor screen printing using SPC
  • Quantify print performance using Cpk
  • Use DOE to identify significant print parameters
  • Reduce paste variation and defects
  • Sustain improvements using SPI-driven control